|
|
|
Title: Laser-assisted GD sputtering for spectrochemical imaging
Researcher: Giovanni Lotito (ESR)
Coordinator: TOFWERK AG, Thun Switzerland; Other partners: AQura, JFC
Responsible scientist: Katrin Fuhrer
Currently the Tofwerk GD-TOF does not have the possibility for imaging, only for depth profiling. This allows for recoding of 3 dimensional data when operating in pulsed Glow Discharge mode (depth, pulse, m/q). Many SIMS (secondary ion mass spectrometer) allow for imaging, e.g. the recording of chemical images. This allows for the analysis of small structures as well as inhomogeneous samples. LAMS (laser ablation mass spectrometer) with post ionisation by glow discharge has been published. A laser is used to desorb material from a surface and a GD plasma is used for post ionisation of the desorbed material.
Project:
In this thesis work a laser will be used to either locally assist GD sputtering or for pure laser ablation. By rastering the laser across the sample surface, image information will be recorded. Mathematical methods will be used for recreating the chemical image. This will result in 4D data (spatial-x, spatial-y, spatial-depth, m/q) or even 5D data when using pulsed GD. To our knowledge there is no commercial instrument with of this type on the market and to our knowledge there is also no research instrument.